–
Статьи в журналах
-
- 2018 Analysis of Total Ionizing Dose effects for highly scaled CMOS devices in Low Earth Orbit
- Sajid M., Chechenin N.G., Torres F.S., Hanif M.N., Gulzari U.A., Arslan S., Khang E.U.
- в журнале Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, издательство Elsevier BV (Netherlands), том 428, с. 30-37 DOI