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Observation of Direct and Indirect Effects of Surface Stabilizer on the Attenuation Coefficient of CdTe Nanoplatelet Filmsстатья Исследовательская статья
Информация о цитировании статьи получена из
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 23 января 2026 г.
- Авторы: Bubenov Sergei, Ospanova Aigerim, Vinokurov Alexander, Kainarbay Asset, Akhmetova Aizhan, Cherednichenko Kirill, Daurenbekov Dulat, Dorofeev Sergey
- Журнал: Nanomaterials
- Том: 15
- Номер: 22
- Год издания: 2025
- Издательство: MDPI
- Местоположение издательства: Basel, Switzerland
- Первая страница: 1
- Последняя страница: 12
- Номер статьи: 1688
- DOI: 10.3390/nano15221688
- Аннотация: Absorption spectra are widely used in laboratory practice to measure the content of agreat variety of colloidal semiconductor nanocrystals. In the case of atomically thinnanoplatelets, only CdSe has been studied enough to allow such quantification, whileCdTe nanoplatelets—a promising material for photodetection—are understudied in thisregard. In this work, a powerful combination of total XRF spectroscopy, absorption spectroscopy and profilometry was employed for thin films to extract the absorption coefficientvalues. The morphology and surface composition of nanoplatelets were studied withTEM and IR spectroscopy. The molar absorption coefficient of oleate-terminated CdTenanoplatelets at the first optical transition was measured at about 5 × 104 L·mol−1·cm−1(per mole of Te), which is among the highest values for AIIBVI nanomaterials. The exchange of stabilizer with hexadecanethiol induced an approximately 5-fold decrease in thevolume fraction of semiconductor material in thin films and a 5-fold decrease in absorbance.The latter effect is linked to the formation of a quasi-type II heterojunction between CdTecores and effectively half of a monolayer shell of CdS. The density effect is explained bythe diminished capacity of nanoscrolls for close packing. The combination of XRF andprofilometry is proposed as a technique for fast nanomorphology evaluation.
- Добавил в систему: Винокуров Александр Александрович
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