Optical methods for measuring the thickness of thin evaporating liquid filmsстатья
Исследовательская статья
Статья опубликована в журнале из списка Web of Science и/или Scopus
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Авторы:
Gatapova Elizaveta Ya,
Peschenyuk Yulia A.
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Журнал:
Journal of Optical Technology
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Том:
91
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Номер:
4
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Год издания:
2024
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Издательство:
Optical Society of America
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Местоположение издательства:
United States
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Первая страница:
285
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Последняя страница:
291
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DOI:
10.1364/JOT.91.000285
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Аннотация:
The subject of the study is the evaporation characteristics, surface deformations, ruptures, thicknesses of droplets, and thin films of liquid evaporating on heated surfaces by optical methods. The problem is relevant to the design of cooling systems for microelectronic devices that rely on the intense evaporation of thin liquid films. The aim of the work is measurement of the thickness of thin liquid films from less than 20 µm to tens of nanometers using non-contact methods, as well as analysis of changes in the rate of evaporation from the surface of a drop and thin film of liquid. Method. Thin liquid film thickness measurements were performed by applying two optical techniques: the image analyzing interference method and the schlieren method with a gradient filter. Main results. Quantitative data on the intensity of thin droplet evaporation on heated surfaces were obtained for volatile and non-volatile liquids. Interferometry with image analysis was used to measure the liquid film thicknesses down to 40 nm and to measure the dynamic contact angle of evaporating thin liquid droplets. The schlieren method with a stepped filter was applied to measure the liquid film thickness on black silicon. The use of a substrate that absorbs light in the visible range allowed us to measure the thickness of liquid films down to 2 µm. From the surface tilt angles, the thickness, surface area, and volume of the droplet were reconstructed to analyze the evaporation intensity. Practical significance. The two optical methods used for measuring the thickness of thin liquid films in this work allow us to determine the thickness in dynamic environments and characterize multiple dry spots occurring during intense evaporation and heating. These methods can be used to measure the receding contact angle. © 2024 Optica Publishing Group.
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Гатапова Елизавета Яковлевна
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