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Techniques of Tracer Diffusion Measurements in Metals, Alloys and Compoundsстатья
- Авторы: Gärtner Daniel, Belkacemi Lisa, Esin Vladimir A., Jomard François, Fedotov Andrey A., Schell Juliana, Osinskaya Julia V., Pokoev Alexander V., Duhamel Cécilie, Paul Aloke, Divinski Sergiy V.
- Журнал: Diffusion Foundations ISSN: 2296-3642
- Том: 29
- Год издания: 2021
- Первая страница: 31
- Последняя страница: 73
- DOI: 10.4028/www.scientific.net/df.29.31
- Аннотация: Tracer diffusion is one of most reliable techniques for providing basic kinetic data in solids. In the present review, selected direct methods, in particular the radiotracer measurements as a superior technique due to its high sensitivity, Secondary-Ion-Mass-Spectroscopy (SIMS) profiling, X-Ray Diffraction measurements and Rutherford Backscattering Spectrometry are presented and discussed.Special attention is put on the radiotracer technique describing the currently used sectioning techniques in detail with a focus on the experimental applications and complications. Relevant experimental results are shown exemplary. Furthermore, the most recent developments and advances related to the combined tracer/inter-diffusion measurements are highlighted. It is shown that this approach offers possibilities to provide the concentration-dependent tracer diffusion coefficients of the constituting elements in multi-component alloys in high-throughput experiments. Possibilities of estimating the tracer diffusion coefficients following different types of diffusion couple methods in binary and multicomponent systems are briefly introduced. Finally, specificity of SIMS analysis of diffusion in fine-grained materials are carefully analyzed. If applicable, a direct comparison of the results obtained by different techniques is given.
- Добавил в систему: Федотов Андрей Александрович