Аннотация:Structural and magnetic characteristics of Co/Cu/Co thin-film systems obtained by magnetron sputtering are investigated. The Co thickness in all samples was 5 nm and the Cu thickness was varied from 0.5 to 4 nm. It was found that the saturation field, HS, oscillates in magnitude with increasing Cu layer thickness with the period of the order of 1 nm. The obtained data are explained by the presence of exchange coupling between the ferromagnetic layers through a Cu spacer and its oscillating behavior with changing tCu.
