HREM and XRD characterization of epitaxial perovskite manganitesстатья
Статья опубликована в высокорейтинговом журнале
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:Thin films of the perovskite manganites solid solutions, including (La, R)1−xAxMnO3 (R=Pr, Nd, A=Ca, Sr, Na) on the single crystalline substrates (LaAlO3, SrTiO3, ZrO2(Y2O3), MgO) were characterized by X-ray diffraction and HREM. Some compounds (like (La1−xPrx)0.7Ca0.3MnO3) have an orthorhombic structure while others (like La1−xNaxMnO3 and La0.7Sr0.3MnO3) are rhombohedral. A strong tetragonal lattice strain owing to the film-substrate lattice mismatch was found in particular in very thin films. In the thicker films this strain was more persistent for compositions the bulk of which is orthorhombic. By HREM, twinning due to the cubic to orthorhombic phase transition was found for (La1−xPrx)0.7Ca0.3MnO3 films, whereas XRD gave the mean tetragonal ratio of the lattice parameters. Misfit dislocations with various Burger vectors occur in the manganites films on LaAlO3 and SrTiO3. An example of the growth of the epitaxial heterostructures with CMR manganites and high Tc superconductors is given.